Apply Filters
Clear All Filters
What do you want to measure?
What's the thickest layer you want to measure?
- ≥10µm (7)
Are any of your samples curved?
- Yes (7)
- No (7)
Do you want a real-time image of your sample?
- No (7)
Single-Spot Measurements |
Model | Thickness Range |
Wavelength Range | Standard Spot Size | |
---|---|---|---|---|---|
F3-CP | Reflectance measurement of flat or curved samples Features: Compact, low-cost, non-UV systems have 40k-hour light source. * Thickness measurement capability is optional. | ||||
F3-CP | 0.015-70 µm * | 380-1050 nm | 100 μm | ||
F10-AR | Reflectance measurement of large flat or curved samples Features: Handheld probe for large samples and maximum versatility. * Thickness measurement capability is optional. | ||||
F10-AR-EXR | 0.2-30 µm * | 380-1700 nm | 100 μm | ||
F10-AR-NIR | 0.5-30 µm * | 950-1700 nm | 100 μm | ||
F10-AR-UV | 0.1-15 µm * | 190-1100 nm | 100 μm | ||
F10-AR-UVX | 0.1-30 µm * | 190-1700 nm | 100 μm | ||
F10-ARc | Reflectance measurement of AR coatings Features: Includes color and reflectance alarms and hardcoat correction. * Thickness measurement capability is optional. | ||||
F10-ARc | 0.2-15 µm * | 380-1050 nm | 100 μm | ||
F10-HC | Reflectance measurement of AR coatings Features: Handheld probe for large samples and maximum versatility. * Thickness measurement | ||||
F10-HC | 0.05-70 µm * | 380-1050 nm | 200 μm |