Optical Profilers Model Thickness
Range
Field-of-View Spatial
Sampling

Profilm3D

Step-height and surface roughness measurements
Features: VIS and PSI measurement capabilities. 100mm of motorized X, Y, and Z translation. Tip/Tilt Stage.
* With 10X objective lens.
Profilm3D 0.001-500 µm 2.0 x 1.7 mm * 0.88 µm *
Single-Spot
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F3

Reflectance and film-thickness measurements
Features: Compact, low-cost, non-UV systems have 40k-hour light source.
* Thickness measurement capability is optional.
F3-NIR 0.1-250 µm * 950-1700 nm 100 μm
F3-XT 0.2-450 µm * 1440-1690 nm 100 μm
F3-s980 10-1000 µm * 960-1000 nm 10 μm
F3-s1310 15-2000 µm * 1280-1340 nm 10 μm
F3-s1550 25-3000 µm * 1520-1580 nm 10 μm
Single-Spot
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F10-RT

Reflectance and/or transmittance measurement
Features: Simultaneous measurement of R and T. Built-in video.
* Thickness measurement capability is optional.
F10-RT-EXR 0.015-150 µm * 380-1700 nm 5000 μm
F10-RT-NIR 0.1-150 µm * 950-1700 nm 5000 μm
F10-RT-UVX 0.003-150 µm * 190-1700 nm 5000 μm

F20

The world's best-selling thin-film measurement system
Features: Our most versatile model. Includes full thickness and index measurement capabilities.
F20-EXR 0.015-250 µm 380-1700 nm 1500 μm
F20-NIR 0.1-250 µm 950-1700 nm 1500 μm
F20-UVX 0.003-250 µm 190-1700 nm 1500 μm
F20-XT 0.2-450 µm 1440-1690 nm 1500 μm
In-line
Measurements
Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F30

Complete in-line thickness monitor
Features: Optional high-speed photodiode detectors.
F30-EXR 0.015-250 µm 380-1700 nm 1500 μm
F30-NIR 0.1-250 µm 950-1700 nm 1500 μm
F30-UVX 0.003-250 µm 190-1700 nm 1500 μm
F30-XT 0.2-450 µm 1440-1690 nm 1500 μm

F32

Compact solution for in-line measurements
Features: Includes spectrometer(s), software, and 10k-hour light source.
F32-EXR 0.015-250 µm 380-1700 nm 1500 μm
F32-NIR 0.1-250 µm 950-1700 nm 1500 μm
F32-UVX 0.003-250 µm 190-1700 nm 1500 μm
F32-XT 0.2-450 µm 1440-1690 nm 1500 μm
F32-s980 10-1000 µm * 960-1000 nm 10 μm
F32-s1310 15-2000 µm * 1280-1340 nm 10 μm
F32-s1550 25-3000 µm * 1520-1580 nm 10 μm
Multi-Point Mapping Model Thickness
Range
Wavelength
Range
Standard
Spot Size

F50

Measures thickness etc. at two points/second
Features: Sample chucks (up to 300mm) sold separately.
F50-EXR 0.02-250 µm 380-1700 nm 1500 μm
F50-NIR 0.1-250 µm 950-1700 nm 1500 μm
F50-UVX 0.005-250 µm 190-1700 nm 1500 μm
F50-XT 0.2-450 µm 1440-1690 nm 1500 μm
F50-s980 4-1000 µm 960-1000 nm 10 μm
F50-s1310 7-2000 µm 1280-1340 nm 10 μm
F50-s1550 10-3000 µm 1520-1580 nm 10 μm

F50-450

Measures thickness on 450mm wafers
Features: Sample chucks (up to 450mm) sold separately.
F50-450-EXR 0.02-250 µm 380-1700 nm 1500 μm
F50-450-NIR 0.1-250 µm 950-1700 nm 1500 μm
F50-450-UVX 0.005-250 µm 190-1700 nm 1500 μm

F50-XY

Measures thickness on large panels
Features: LCD panels are a common application.
F50-XY 0.02-100 µm 380-1050 nm 1500 μm
F50-XY-EXR 0.02-250 µm 380-1700 nm 1500 μm
F50-XY-NIR 0.1-250 µm 950-1700 nm 1500 μm
F50-XY-UVX 0.005-250 µm 190-1700 nm 1500 μm
F50-XY-XT 0.2-450 µm 1440-1690 nm 1500 μm

F54

Automated film thickness mapping
Features: Sample chucks (up to 450mm) sold separately.
F54-EXR 0.02-100 µm 400-1700 nm 7 μm
F54-NIR 0.04-100 µm 950-1700 nm 7 μm
F54-UVX 0.004-100 µm 190-1700 nm 7 μm

F60-t

Production-oriented film thickness mapping
Features: Includes notch-finding, on-board baselining, and safety interlock.
F60-t-EXR 0.02-250 µm 380-1700 nm 1500 μm
F60-t-NIR 0.1-250 µm 950-1700 nm 1500 μm
F60-t-UVX 0.005-250 µm 190-1700 nm 1500 μm
F60-t-XT 0.2-450 µm 1440-1690 nm 1500 μm
F60-t-s980 4-1000 µm 960-1000 nm 10 μm
F60-t-s1310 7-2000 µm 1280-1340 nm 10 μm
F60-t-s1550 10-3000 µm 1520-1580 nm 10 μm